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The major advantage is that arbitrarily shaped virtual apertures generated with image processing software can be designed without facing any physical limitations. The reconstructed virtual images are compared with conventional TEM images. The experimental procedures of both methods are presented in the paper and are applied to a precipitation strengthened and creep deformed ferritic alloy with a complex microstructure. The resulting datasets allow the reconstruction of either electron diffraction patterns, or bright-, dark- or annular dark-field images using virtual apertures. Similarly, a tilt series of TEM dark-field images is acquired. In a STEM-based approach, diffraction patterns are recorded for each beam position using a small probe convergence angle.

Two methods on how to obtain the full diffraction information from a sample region and the associated reconstruction of images or diffraction patterns using virtual apertures are demonstrated.

Virtual imaging